California Instruments 1251RP Series Manual de usuario descargar pdf (Pagina 5)

iX-Series based CTS systems are supplied with additional software that allows a series of AC immunity tests to be

performed on the unit under test. Pass or Fail results are determined by the user based on an evaluation of the unit under

test at the end of the test run.

IEC 61000-4-11 Voltage Dips and Interruptions Test

The Voltage Dips and Interruptions test are included in the

AC source control program supplied with the CTS system.

The operator is presented with a simple screen that shows

the type of test that will be run and the test duration. The

operator can enter the desired nominal test voltage and

frequency.

Clearly labeled buttons are provided for Test Run and Test

Abort. During the test run, the EUT load current is mea-

sured to help the operator observe any EUT failures.

Test parameters can be changed by the user if needed to

accommodate different test levels called out by product stan-

dard committees. For AC source compliance, the EOS op-

tion is required. This option is available on 3001iX-CTS,

5001iX-CTS and 15003iX-CTS systems.

IEC 61000-4-13 Harmonics and Interharmonics

The iX Series AC/DC Source can be equipped with the

-413 option to provide full support for IEC 61000-4-13 Har-

monics and Interharmonics testing. An independent, digi-

tally controlled sweep generator is used to superimpose

interharmonics on the AC output. The high speed data

acquisition system is used to determine EUT resonance

points during the frequency sweep test. Flat top curve and

overswing curve waveforms are generated using the arbi-

trary waveform generation capability of the iX Series AC/

DC source.

At the end of the test run, a detailed test report can be

printed for complete documentation of test setup and re-

sults.

IEC 61000-4-14 Voltage Fluctuations, IEC 61000-

4-17 DC Ripple

& IEC 61000-4-28 Frequency

Variations

Rounding out the suite of IEC 61000-4 test programs are

IEC 61000-4-14 Voltage Fluctuations, IEC 61000-4-17 DC

Ripple and IEC 61000-4-28 Frequency Variations immu-

nity tests. Test parameters are pre-programmed or can be

modified easily if needed. The user is capable of specifying

a library of test sequences and test levels for different prod-

uct categories. These test setups can be quickly recalled

for application to the EUT.

At the end of each test run, a test report can be generated

by clicking on the Print Report button.

Compliant IEC 61000-4 Tests are not supported on RP-Series based CTS systems or systems without an AC source (100-CTS and 300-CTS).

IEC 61000-4-11 AC Source compliance requires -EOS option.

IEC 61000-4-13 test requires -413 option.

IEC 61000-4-17 test requires iX Series based CTS systems.

IEC 61000-4-11 Test Window

IEC 61000-4-13 Test Window

IEC 61000-4-14 Test Window

CTS Series - IEC 61000-4 Immunity Test

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